Spectroscopic ellipsometry of Ni3Al in comparison with band-structure calculations
نویسندگان
چکیده
منابع مشابه
Spectroscopic ellipsometry study
The dielectric functions of InP, IIla.53 Gao.47 As, and 1110.75 Gao.2S Aso.s P 0.5 epitaxial layers have been measured using a polarization-modulation spectroscopic ellipsometer in the 1.5 to 5.3 eV region. The oxide removal procedure has been carefully checked by comparing spectroscopic ellipsometry and x-ray photoelectron spectroscopy measurements. These reference data have been used to inves...
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This article provides a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique, in that information about the physical properties of a sample is obtained through modeling analysis. Standard ellipsometry is typically used to characterize optically isotropic bulk and/or layered materials. More advanced tec...
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In this paper, a new algorithm for studying elastic wave propagation in the phononic crystals is presented. At first, the displacement-based forms of elastic wave equations are derived and then the forms are discretized using finite difference method. So the new algorithm is called the displacement-based finite difference time domain (DBFDTD). Three numerical examples are computed with this met...
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چکیده ندارد.
15 صفحه اولSpectroscopic ellipsometry of metal phthalocyanine thin films.
Optical functions of cobalt phthalocyanine, nickel phthalocyanine (NiPc), and iron phthalocyanine (FePc) have been determined by use of spectroscopic ellipsometry in the spectral range 1.55-4.1 eV (300-800 nm). The samples were prepared by evaporation onto glass and silicon substrates. The optical functions were determined by point-to-point fit. Absorption spectra were also measured. The index-...
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ژورنال
عنوان ژورنال: Journal of Physics F: Metal Physics
سال: 1985
ISSN: 0305-4608
DOI: 10.1088/0305-4608/15/5/024